• DocumentCode
    2940707
  • Title

    A 10b Ternary SAR ADC with decision time quantization based redundancy

  • Author

    Guerber, Jon ; Gande, Manideep ; Venkatram, Hariprasath ; Waters, Allen ; Moon, Un-Ku

  • Author_Institution
    Sch. of EECS, Oregon State Univ., Corvallis, OR, USA
  • fYear
    2011
  • fDate
    14-16 Nov. 2011
  • Firstpage
    65
  • Lastpage
    68
  • Abstract
    The design of a Ternary Successive Approximation ADC (TSAR) with decision time quantization is proposed. The TSAR examines the transient information of the typical SAR comparator to provide full half-bit redundancy, an increased monotonicity switching algorithm, speed enhancements without inherent metastability, residue shaping effects, and stage skipping. A prototype is fabricated in 0.13μm CMOS employing on-chip statistical time reference calibration and supply variability from 0.8 to 1.2V. The chip consumes 84μW at 8 MHz for a FOM of 16fJ/C-S.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; CMOS; decision time quantization based redundancy; frequency 8 MHz; full half-bit redundancy; monotonicity switching algorithm; on-chip statistical time reference calibration; power 84 muW; size 0.13 mum; speed enhancements; supply variability; ternary successive approximation ADC; typical SAR comparator; voltage 0.8 V to 1.2 V; Calibration; Capacitors; Clocks; Delay; Quantization; Redundancy; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian
  • Conference_Location
    Jeju
  • Print_ISBN
    978-1-4577-1784-0
  • Type

    conf

  • DOI
    10.1109/ASSCC.2011.6123605
  • Filename
    6123605