• DocumentCode
    2942522
  • Title

    Advanced processing techniques of high voltage impulse test signals

  • Author

    Angrisani, L. ; Daponte, P. ; Dias, C. ; Vale, A. Almeida Do

  • Author_Institution
    Dept. of Inf. & Electr. Eng., Salerno Univ., Italy
  • Volume
    2
  • fYear
    1997
  • fDate
    19-21 May 1997
  • Firstpage
    1136
  • Abstract
    The paper deals with a new technique, based on the wavelet transform, for the digital processing of high voltage impulses. A brief theoretical outline about the proposed technique is first reported. Technique assessment is then carried out through numerical tests on simulated HV impulses presenting typical disturbances superposed. Finally, experimental results show technique reliability if applied to actual HV impulses
  • Keywords
    high-voltage techniques; signal processing; testing; wavelet transforms; actual HV impulses; digital processing; high voltage impulse test signals; high voltage impulses; reliability; simulated HV impulses; wavelet transform; Circuit noise; Circuit testing; Electromagnetic interference; Frequency; Impulse testing; Shape measurement; Signal processing; System testing; Voltage; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
  • Conference_Location
    Ottawa, Ont.
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-3747-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1997.612378
  • Filename
    612378