Nonlinear analysis of movement-related changes in human subthalamic local field potentials

Author

Wei, Chun-Shu ; Tsai, Chon-Haw ; Chiou, Shang-Ming ; Hseu, Yi-Ting ; Liu, Ta-Wei ; Lai, Hsin-Yi ; Chien, Ting-Fang ; Kuo, Yi-Hsuan ; Zhao, Wan-Ting ; Tang, Yu-Shun ; Su, Sheng Yuan ; Chen, You-Yin

Author_Institution

Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

fYear

2010

fDate

Aug. 31 2010-Sept. 4 2010

Firstpage

4132

Lastpage

4135

Abstract

Movement-related changes such as event-related desynchronizationcan (ERD) and event-related synchronization (ERS) can be found in human subthalamic nucleus (STN) with analysis on local field potentials (LFP) recorded from Parkinson´s disease (PD) patients. Besides traditional time-frequency (TF) analysis, we introduced nonlinear analysis, bispectral and approximate entropy (ApEn), to measure the signal nonlinear correlation and regularity in neural activities. Movement-related changes were found in the beta band, bicoherence and ApEn, and variation during stationary movement is more available by nonlinear methods. Therefore, we suggest nonlinear analysis for further related studies.

Keywords

bioelectric potentials; brain; diseases; entropy; medical signal processing; neurophysiology; nonlinear estimation; synchronisation; time-frequency analysis; Parkinson´s disease; approximate entropy; beta band; bicoherence; bispectral entropy; event-related desynchronization; event-related synchronization; human subthalamic local field potentials; human subthalamic nucleus; movement-related changes; neural activities; nonlinear analysis; signal nonlinear correlation; stationary movement; time-frequency analysis; Correlation; Electroencephalography; Electromyography; Entropy; Oscillators; Synchronization; Time frequency analysis; Aged; Deep Brain Stimulation; Evoked Potentials; Female; Humans; Male; Middle Aged; Nonlinear Dynamics; Parkinson Disease;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE

Conference_Location

Buenos Aires

ISSN

1557-170X

Print_ISBN

978-1-4244-4123-5

Type

conf

DOI

10.1109/IEMBS.2010.5627367

Filename

5627367