Fault and diagnosis on a successive approximation ADC

Author

Marc, François ; Dallet, Dominique ; Danto, Yves

Author_Institution

Lab. de Microelectron., Bordeaux I Univ., Talence, France

Volume

2

fYear

1997

fDate

19-21 May 1997

Firstpage

1460

Abstract

In successive approximation A/D converters, the origin of failure is located through the bit error which is computed from the histogram, if it fulfil some conditions. In this paper, we present the real case of a failing A/D converter whose bit error is not computable. Consequently, the failure localization is performed using an alternative methodology including external electrical characterization and electron beam testing (EBT)

Keywords

Walsh functions; analogue-digital conversion; electron beam testing; electron device testing; fault location; statistical analysis; transforms; voltage measurement; A/D converter; bit error; electron beam testing; external electrical characterization; failure localization; fault location; histogram; successive approximation ADC; Circuit testing; Contacts; Current measurement; Electric variables measurement; Electron beams; Failure analysis; Fault diagnosis; Histograms; Performance evaluation; Statistical analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE

Conference_Location

Ottawa, Ont.

ISSN

1091-5281

Print_ISBN

0-7803-3747-6

Type

conf

DOI

10.1109/IMTC.1997.612441

Filename

612441