• DocumentCode
    2944504
  • Title

    High-speed operation of a resonant tunneling flip-flop circuit employing a MOBILE (monostable-bistable transition logic element)

  • Author

    Maezawa, K. ; Matsuzaki, H. ; Arai, K. ; Otsuji, T. ; Yamamoto, M.

  • Author_Institution
    NTT Syst. Electron. Lab., Kanagawa, Japan
  • fYear
    1997
  • fDate
    23-25 June 1997
  • Firstpage
    94
  • Lastpage
    95
  • Abstract
    Resonant tunneling (RT) devices attract much attention because of their potential for high-speed operation as well as their high functionality, which leads to lower power dissipation. We have developed a highly functional logic gate, called MOBILE (monostable-bistable transition logic element), which exploits the negative differential resistance (NDR) of the RT phenomenon. In this paper, we demonstrate the high-speed operation-up to 18 Gb/s-of the MOBILE flip-flop (FF) circuit at room temperature. The present result indicates the promise of MOBILE-based FF circuits for high-speed digital applications.
  • Keywords
    active networks; flip-flops; negative resistance devices; resonant tunnelling devices; 18 Gbit/s; MOBILE; high-speed operation; monostable-bistable transition logic element; negative differential resistance; resonant tunneling flip-flop circuit; Bit rate; Circuit testing; Clocks; Electron devices; Flip-flops; HEMTs; Logic devices; RLC circuits; Resonant tunneling devices; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 1997. 5th
  • Conference_Location
    Fort Collins, CO, USA
  • Print_ISBN
    0-7803-3911-8
  • Type

    conf

  • DOI
    10.1109/DRC.1997.612488
  • Filename
    612488