• DocumentCode
    2946263
  • Title

    A ruggedly packaged D-Band GaAs Gunn diode with hot electron injection suitable for volume manufacture

  • Author

    Farrington, N. ; Norton, P. ; Carr, M. ; Sly, J. ; Missous, M.

  • Author_Institution
    Microelectronics and Nanostructures Group, School of Electrical&Electronic Engineering, University of Manchester, M60 1QD, UK
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    281
  • Lastpage
    284
  • Abstract
    GaAs Gunn diodes optimized for use in second harmonic mode at 125 GHz have been fabricated with hot electron injection based on a novel step-graded AlxGa(1-x)As launcher. Testing was performed after encapsulation in rugged, hermetically sealed packages using a similar process to that performed for volume manufacture of devices for the automotive industry. RF power levels up to 40 mW at 121.5 GHz in second harmonic mode have been obtained with an efficiency of 1.45% and an average frequency drift of 0.5 MHz/degC. Unlike the majority of state-of-the-art unpackaged devices reported in the literature which rely on diamond heat sinking, these packaged devices incorporate an integral gold heatsink, and so offer lower unit cost, increased manufacturability, and ease of integration into real-world systems.
  • Keywords
    Gunn diodes; aluminium compounds; gallium arsenide; heat sinks; hot carriers; millimetre wave diodes; semiconductor device packaging; semiconductor device testing; AlxGa(1-x)As; RF power levels; efficiency 1.45 percent; frequency 125 GHz; hermetically sealed packages; hot electron injection; integral gold heatsink; ruggedly packaged D-band Gunn diode; second harmonic mode; volume manufacture; Diodes; Encapsulation; Gallium arsenide; Gunn devices; Heat sinks; Manufacturing; Packaging; Performance evaluation; Secondary generated hot electron injection; Testing; Gunn devices; millimeter-wave generation; millimeter-wave oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633158
  • Filename
    4633158