DocumentCode
2946553
Title
Charge injection into solid insulators
Author
McCuistian, B.T. ; Hatfield, L.L.
Author_Institution
Dept. of Phys., Texas Tech. Univ., Lubbock, TX, USA
Volume
2
fYear
1995
fDate
3-6 July 1995
Firstpage
840
Abstract
Electrical conduction in insulators requires the presence of charge carriers. When an insulator is stressed at high fields between two electrodes, charge injection into the bulk can occur from the cathode. This injected charge is then able to influence the insulator and affect its voltage hold-off capabilities and other electrical properties. An experimental apparatus has been constructed to study insulators stressed under high fields in a vacuum. The equivalent circuit of the experiment consists of two meshes which oscillate at different frequencies. The point-plane geometry of the electrodes and insulator appear in a mesh that oscillates at a higher frequency and much lower amplitude than the applied high voltage signal. One capacitive probe is coupled to both frequency components with the necessary voltage division ratios needed to detect both frequency components simultaneously. Separation of the two frequency components by use of Fourier transform techniques allows charge injection information to be extracted from the measured voltage waveform. A description of this method and results, including charge injection inception voltages is presented.
Keywords
electric breakdown; electric charge; electric strength; electrodes; insulator testing; Fourier transform techniques; cathode; charge carriers; charge injection; electrical properties; equivalent circuit; inception voltages; insulator breakdown tests; point-plane geometry; solid insulators; voltage hold-off capabilities; voltage waveform measurements; Cathodes; Charge carriers; Dielectrics and electrical insulation; Electrodes; Equivalent circuits; Frequency conversion; Geometry; Probes; Solids; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 1995. Digest of Technical Papers., Tenth IEEE International
Conference_Location
Albuquerque, NM, USA
Print_ISBN
0-7803-2791-8
Type
conf
DOI
10.1109/PPC.1995.599716
Filename
599716
Link To Document