Magnetometry methods for thin film edge property measurements

We describe two techniques in this paper that use vector magnetometry to determine the straightness and the edge characteristics of arrays of long, straight, thin-film stripes. A variety of measurement techniques are available for characterizing bulk materials, thin films and even thin film interfaces, but few techniques are available for characterization of thin film edges. The magnetic properties of edges are important because they can determine the behavior of thin film devices. In very small patterned elements, the entire film is coupled to the edge by exchange and magnetostatic effects, and in larger elements, reversal often nucleates at the edge.