• DocumentCode
    2947327
  • Title

    A derived circuit model for spiral inductors on lossy silicon substrate

  • Author

    Yang, Kai ; Wu, Ke-Li ; Hu, Hai ; Yin, Wen-Yan ; Mao, Jun-Fa

  • Author_Institution
    Department of Electronic Engineering, The Chinese University of Hong Kong, China
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    511
  • Lastpage
    514
  • Abstract
    This paper presents a novel approach for deriving a physically meaningful circuit model for multilayered spiral inductors on lossy silicon substrates. The approach starts from a quasi-static Partial Element Equivalent Circuit (PEEC) model. The concept of complex inductance and capacitance is introduced to account for the conductor and dielectric losses. Basic Y-Delta network transformation is employed to ldquoabsorbrdquo the insignificant internal nodes of the original PEEC network progressively. The physically meaningful circuit models of two practical inductors fabricated using 0.18 mum CMOS process are derived to demonstrate the use of the approach for RFIC applications. Excellent agreement of the Q performances as well as the circuit responses of the derived circuit model with those from the measurements over the frequency range from 0.45 GHz to 10 GHz demonstrates the validity and the powerfulness of this new approach.
  • Keywords
    CMOS integrated circuits; capacitance; dielectric losses; equivalent circuits; inductance; inductors; multilayers; radiofrequency integrated circuits; CMOS process; RFIC; capacitance; complex Inductance; derived circuit model; dielectric losses; lossy silicon substrates; multilayered spiral Inductors; network transformation; quasistatic partial element equivalent circuit model; Capacitance; Conductors; Dielectric losses; Dielectric substrates; Equivalent circuits; Inductance; Inductors; Semiconductor device modeling; Silicon; Spirals; Equivalent circuits; RFIC; inductor; model order reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633215
  • Filename
    4633215