• DocumentCode
    2951492
  • Title

    Performance of hybrid circuit components under deep ocean pressure

  • Author

    Holzschuh, Jack E.

  • Author_Institution
    Naval Undersea Center, San Diego, CA, USA
  • fYear
    1973
  • fDate
    25-28 Sept. 1973
  • Firstpage
    336
  • Lastpage
    340
  • Abstract
    If hybrid circuitry is to be used in the deep ocean, unprotected from the high pressure encountered there, the performance of the various components that make up the circuitry must be known. To determine this performance, both thick-film and thin-film hybrid circuitry was pressure tested. The first series of tests (up to 15 000 psig) were on thick-film and thin-film resistors and ceramic chip capacitors. The components were fabricated and mounted by using ordinary hybrid techniques and were then enclosed in a standard hybrid package. Prior to being pressure tested, the package was filled with an inert liquid. The results of these tests indicated that at 15 000 psig (1) thin-film resistors are very stable, having a \\Delta R (change in resistance) of -100 to -400 ppm, (2) thick-film resistors have \\Delta R\´s of up to 43%, (3) ceramic chip capacitors (both NPO and non-NPO), glass capacitors, and solid tantalum capacitors have \\Delta C\´s of less than \\pm 5 %, and (4) Zener diodes have \\Delta V\´s of less than 0.3%.
  • Keywords
    Capacitors; Ceramics; Chemicals; Circuit testing; Dielectrics; Electronics packaging; Oceans; Resistors; Solids; Thin film circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in the Ocean Environment, Ocean 73 - IEEE International Conference on
  • Conference_Location
    Seattle, WA, USA
  • Type

    conf

  • DOI
    10.1109/OCEANS.1973.1161280
  • Filename
    1161280