• DocumentCode
    2952950
  • Title

    Considering layout for test scheduling of core-based SoCs

  • Author

    Xia, Yu ; Chrzanowska-Jeske, Malgorzata

  • Author_Institution
    Electr. & Comput. Eng., Portland State Univ., Portland, OR
  • fYear
    2005
  • fDate
    11-14 Dec. 2005
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We consider a test-scheduling problem, with layout constraints, for core-based SOCs. Individual cores have to be tested on a system level after manufacturing and therefore special test access mechanisms (TAMs) are required. The amount of additional wires needed to route TAMs depends strongly on a SOC layout. In this research, we investigate the SOC test-scheduling problem formulated as the bin-packing problem and constrained by a physical layout of a SOC. We solve the problem using evolutionary strategy and sequence-pair representation. Our results, for ITC´02 benchmarks, show that for most examples, our algorithm generates solutions with less interconnects.
  • Keywords
    integrated circuit layout; scheduling; system-on-chip; SOC layout; individual cores; system-on-chip; test access mechanisms; test scheduling; Design optimization; Evolutionary computation; Job shop scheduling; Logic testing; Manufacturing; Pins; Processor scheduling; Routing; System testing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2005. ICECS 2005. 12th IEEE International Conference on
  • Conference_Location
    Gammarth
  • Print_ISBN
    978-9972-61-100-1
  • Electronic_ISBN
    978-9972-61-100-1
  • Type

    conf

  • DOI
    10.1109/ICECS.2005.4633599
  • Filename
    4633599