DocumentCode
2953731
Title
Designing the best clock distribution network
Author
Restle, P.J. ; Deutsch, A.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
1998
fDate
11-13 June 1998
Firstpage
2
Lastpage
5
Abstract
Clock distribution has become an increasingly challenging problem for VLSI designs, consuming an increasing fraction of resources such as wiring, power, and design time. Unwanted differences or uncertainties in clock network delays degrade performance or cause functional errors. Three dramatically different strategies being used in the VLSI industry to address these challenges are compared. Novel modeling and measurement techniques are used to investigate on-chip transmission-line effects that are important for high performance clock distribution networks.
Keywords
VLSI; capacitance; delays; digital integrated circuits; integrated circuit design; timing circuits; VLSI designs; clock distribution network design; clock network delays; measurement techniques; modeling techniques; on-chip transmission-line effects; Clocks; Delay effects; Integrated circuit interconnections; Microprocessors; Network topology; Transmission lines; Uncertainty; Very large scale integration; Wires; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on
Conference_Location
Honolulu, HI, USA
Print_ISBN
0-7803-4766-8
Type
conf
DOI
10.1109/VLSIC.1998.687985
Filename
687985
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