DocumentCode
2954117
Title
Denoising in fluorescence microscopy using compressed sensing with multiple reconstructions and non-local merging
Author
Marim, Marcio ; Angelini, Elsa ; Olivo-Marin, Jean-Christophe
Author_Institution
Inst. Pasteur, CNRS, Paris, France
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
3394
Lastpage
3397
Abstract
The cross-dependency of noise level and photobleaching in microscopy was discussed in a previous work and an efficient compressed sensing (CS) method was proposed to simultaneously reduce the noise level and the photobleaching. Here we present an improved CS denoising framework for fluorescence microscopy images, exploiting Non-Local means filtering to merge multiple reconstructions. This framework enables high-quality reconstruction of low exposed microscopy images based on random Fourier sampling schemes and multiple CS reconstructions. Practical experiments on fluorescence images demonstrate that even performing 10% of the measurements, the signal-to-noise ratio can be significantly improved while keeping reduced exposure time, preserving edges and the image sharpness.
Keywords
Fourier transforms; bio-optics; biomedical optical imaging; filtering theory; fluorescence; image denoising; image reconstruction; image sampling; medical image processing; optical microscopy; compressed sensing; fluorescence microscopy; image denoising; multiple reconstructions; nonlocal means filtering; nonlocal merging; random Fourier sampling; signal-to-noise ratio; Image reconstruction; Microscopy; Noise measurement; Noise reduction; Pixel; Signal to noise ratio; Compressed sensing; NL-means filtering; denoising; fluorescence microscopy; Algorithms; Artifacts; Artificial Intelligence; Data Compression; Image Enhancement; Image Interpretation, Computer-Assisted; Microscopy, Fluorescence; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5627931
Filename
5627931
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