Soft Core Embedded Processor Based Built-In Self-Test of FPGAs

Author

Dutton, Bradley F. ; Stroud, Charles E.

Author_Institution

Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA

fYear

2009

fDate

7-9 Oct. 2009

Firstpage

29

Lastpage

37

Abstract

This paper presents the first implementation of built-in self-test (BIST) of field programmable gate arrays (FPGAs) using a soft core embedded processor for reconfiguration of the FPGA resources under test, control of BIST execution, retrieval of BIST results, and fault diagnosis. The approach was implemented in Xilinx Virtex-5 FPGAs but is applicable to any FPGA that contains an internal configuration memory access port.

Keywords

built-in self test; embedded systems; field programmable gate arrays; integrated circuit testing; microprocessor chips; FPGA; Xilinx Virtex-5; built-in self test; field programmable gate arrays; internal configuration memory access port; soft core embedded processor; Automatic testing; Built-in self-test; Circuit testing; Fabrics; Fault diagnosis; Fault tolerant systems; Field programmable gate arrays; Logic testing; Reconfigurable logic; System testing; Built-In Self-Test; Field Programmable Gate Array; Soft Processor; Xilinx Virtex-5;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on

Conference_Location

Chicago, IL

ISSN

1550-5774

Print_ISBN

978-0-7695-3839-6

Type

conf

DOI

10.1109/DFT.2009.51

Filename

5372277