• DocumentCode
    2958519
  • Title

    Wavelength-tuned phase-shifting calibration based on the fourier transform in time domain

  • Author

    Ren-hui, Guo ; Jian-xin, Li ; Ri-hong, Zhu ; Lei, Chen

  • Author_Institution
    Inst. of Electron. Eng. & Photoelectronic Technol., Nanjing Univ. of Sci. & Technol., Nanjing, China
  • fYear
    2009
  • fDate
    22-24 July 2009
  • Firstpage
    371
  • Lastpage
    375
  • Abstract
    The phase-shifting interferometer using a wavelength tunable laser is applied to test large optical components. A method based on the one-dimensional Fourier transform in time domain to calibrate the phase in wavelength-tuned phase-shifting interferometer is presented. It solves the problem that how to control the phase-shifting step to a certain value at different interferometric cavity lengths when testing. The calibration software is written and the wavelength-tuned phase-shifting interferometer using a tunable laser with the central wavelength 632.8 nm is established. In the experiments, the results are compared with the results obtained by the ZYGO interferometer. It shows that when the cavity length is less than 2 m, the testing precision is lambda/50.
  • Keywords
    Fourier transform optics; calibration; laser cavity resonators; laser tuning; measurement by laser beam; optical testing; phase shifting interferometry; time-domain analysis; ZYGO interferometer; interferometric cavity length; one-dimensional Fourier transform; optical component testing; phase-shifting interferometer; time domain; wavelength tunable laser; wavelength-tuned phase-shifting calibration; Calibration; Fourier transforms; Laser theory; Laser tuning; Optical devices; Optical interferometry; Phase shifting interferometry; Space technology; Testing; Tunable circuits and devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Service Operations, Logistics and Informatics, 2009. SOLI '09. IEEE/INFORMS International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-3540-1
  • Electronic_ISBN
    978-1-4244-3541-8
  • Type

    conf

  • DOI
    10.1109/SOLI.2009.5203961
  • Filename
    5203961