• DocumentCode
    2960564
  • Title

    Novel high positive and negative pumping circuits for low supply voltage

  • Author

    Lin, Hongchin ; Chang, Kai-Hsun ; Wong, Shyh-Chyi

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chung-Hsing Univ., Taichung, Taiwan
  • Volume
    1
  • fYear
    1999
  • fDate
    36342
  • Firstpage
    238
  • Abstract
    Novel charge pumping circuits for low supply voltages utilizing N-MOSFET´s or P-MOSFET´s with capacitors to generate positive and negative boosted voltages are presented. The two major factors limiting the pumping gain and efficiency are the body effect and the threshold voltage. Two techniques are proposed to minimize the influence of them. One is the new substrate connected technique to eliminate the body effect. The other one is the small pumping circuit providing higher gate voltages for the major pumping circuit to enhance pumping gain. With these two new techniques, the new pumping circuits have high positive and negative boosted voltages at low supply voltages
  • Keywords
    VLSI; electric charge; flash memories; integrated memory circuits; low-power electronics; 1 V; LV operation; NMOSFETs; PMOSFETs; body effect elimination; capacitors; charge pumping circuits; efficiency; flash EEPROM; low supply voltage; memory circuits; negative boosted voltages; positive boosted voltages; pumping gain enhancement; substrate connected technique; threshold voltage; Capacitors; Charge pumps; Charge transfer; Clocks; EPROM; Leakage current; Low voltage; MOSFET circuits; Random access memory; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-5471-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1999.777847
  • Filename
    777847