DocumentCode
2960564
Title
Novel high positive and negative pumping circuits for low supply voltage
Author
Lin, Hongchin ; Chang, Kai-Hsun ; Wong, Shyh-Chyi
Author_Institution
Dept. of Electr. Eng., Nat. Chung-Hsing Univ., Taichung, Taiwan
Volume
1
fYear
1999
fDate
36342
Firstpage
238
Abstract
Novel charge pumping circuits for low supply voltages utilizing N-MOSFET´s or P-MOSFET´s with capacitors to generate positive and negative boosted voltages are presented. The two major factors limiting the pumping gain and efficiency are the body effect and the threshold voltage. Two techniques are proposed to minimize the influence of them. One is the new substrate connected technique to eliminate the body effect. The other one is the small pumping circuit providing higher gate voltages for the major pumping circuit to enhance pumping gain. With these two new techniques, the new pumping circuits have high positive and negative boosted voltages at low supply voltages
Keywords
VLSI; electric charge; flash memories; integrated memory circuits; low-power electronics; 1 V; LV operation; NMOSFETs; PMOSFETs; body effect elimination; capacitors; charge pumping circuits; efficiency; flash EEPROM; low supply voltage; memory circuits; negative boosted voltages; positive boosted voltages; pumping gain enhancement; substrate connected technique; threshold voltage; Capacitors; Charge pumps; Charge transfer; Clocks; EPROM; Leakage current; Low voltage; MOSFET circuits; Random access memory; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location
Orlando, FL
Print_ISBN
0-7803-5471-0
Type
conf
DOI
10.1109/ISCAS.1999.777847
Filename
777847
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