DocumentCode
2961821
Title
Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor
Author
Jeffery, A. ; Lee, L.H. ; Shields, J.Q.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
1998
fDate
6-10 July 1998
Firstpage
454
Lastpage
455
Abstract
A calculable capacitor links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2/spl times/10/sup -8/. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce this uncertainty.
Keywords
capacitance measurement; capacitors; electrodes; measurement standards; measurement uncertainty; units (measurement); NIST calculable capacitor; SI unit; US capacitance unit; blocking electrode; capacitance standard; cross-capacitor; eccentricity effect; geometrical imperfections effect; local imperfections; model calculable capacitor; model tests; relative standard uncertainty; tilt effect; uniform taper; Bars; Capacitance; Capacitors; Electrodes; Length measurement; NIST; Position measurement; Probes; Solid modeling; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-5018-9
Type
conf
DOI
10.1109/CPEM.1998.700000
Filename
700000
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