DocumentCode
2962777
Title
Acceleration of fault attack emulation by consideration of fault propagation
Author
Krieg, Armin ; Grinschgl, J. ; Steger, Christian ; Weiss, Rebecca ; Bock, H. ; Haid, J.
Author_Institution
Inst. for Tech. Inf., Graz Univ. of Technol., Graz, Austria
fYear
2012
fDate
10-12 Dec. 2012
Firstpage
239
Lastpage
242
Abstract
In recent years the number of deployed embedded systems increased significantly. These system-on-chips are widely used for high-availability as well as security applications. Therefore, the reliable operation of these devices plays a vital role and disturbed operation can lead to loss of confidence and trust. To ensure correct operation during random or intentional fault events, injection techniques for system simulation and emulation have been presented. The targeted use of these approaches is often difficult because of the device complexity and the lack of knowledge about internal processes after a fault has been activated. To improve the current state-of-the-art in this field this paper presents fault propagation analysis and hardware checker generation techniques based on static VHDL code analysis. These help to gain a deeper understanding of system internal propagation paths and their influence on normal operation. Physical layout data is included to enable the mapping of a fault attack location to its corresponding logic gates. Hardware checkers enable higher fault injection evaluation efficiency by removing masked system parts from the target space.
Keywords
embedded systems; fault diagnosis; hardware description languages; logic gates; system-on-chip; embedded systems; fault attack emulation; fault events; fault propagation analysis; hardware checker generation; injection techniques; logic gates; static VHDL code analysis; system-on-chips; Circuit faults; Emulation; Hardware; Laser theory; Layout; Logic gates; Security;
fLanguage
English
Publisher
ieee
Conference_Titel
Field-Programmable Technology (FPT), 2012 International Conference on
Conference_Location
Seoul
Print_ISBN
978-1-4673-2846-3
Electronic_ISBN
978-1-4673-2844-9
Type
conf
DOI
10.1109/FPT.2012.6412141
Filename
6412141
Link To Document