• DocumentCode
    296353
  • Title

    High quality InGaAsP/InP multiple quantum well modulator structures for 1.3 and 1.5 μm applications

  • Author

    Mendonça, C. A C ; Chiu, T.H.

  • Author_Institution
    Inst. de Fisica Gleb Wataghin, Univ. Estadual de Campinas, Sao Paulo, Brazil
  • fYear
    1996
  • fDate
    21-25 Apr 1996
  • Firstpage
    549
  • Lastpage
    552
  • Abstract
    We report on high quality InGaAsP/InP multiple quantum well structures grown by chemical beam epitaxy with absorption at the 1.3 to 1.5 μm range. Transmission profiles with remarkable excitonic features and sharply defined absorption edges for p-i-n samples with as many as 200 periods are shown to be achievable. Very sharp satellite peaks with linewidth comparable with that from the substrate are shown in the X-ray diffraction. We use a new method to monitor the substrate temperature which shows excellent results in terms of homogeneity of layer thickness and composition even for structures with a large number of periods
  • Keywords
    III-V semiconductors; X-ray diffraction; chemical beam epitaxial growth; electro-optical modulation; excitons; gallium arsenide; gallium compounds; indium compounds; light absorption; light transmission; photoluminescence; semiconductor quantum wells; 1.3 to 1.5 mum; InGaAsP-InP; InGaAsP/InP multiple quantum well modulator structures; X-ray diffraction; absorption edges; chemical beam epitaxy; composition; electroabsorption modulators; excitonic features; layer thickness; linewidth; p-i-n samples; satellite peaks; substrate temperature; transmission profiles; Chemicals; Electromagnetic wave absorption; Epitaxial growth; Indium phosphide; Molecular beam epitaxial growth; PIN photodiodes; Satellites; Substrates; Temperature measurement; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
  • Conference_Location
    Schwabisch-Gmund
  • Print_ISBN
    0-7803-3283-0
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1996.492305
  • Filename
    492305