DocumentCode
2965127
Title
A New DC-Offset and I/Q-Mismatch Compensation Technique for a CMOS Direct-Conversion WLAN Transmitter
Author
Yanagisawa, Kiyoshi ; Matsuno, Noriaki ; Maeda, Tadashi ; Tanaka, Shinichi
Author_Institution
NEC Corp., Kanagawa
fYear
2007
fDate
3-8 June 2007
Firstpage
85
Lastpage
88
Abstract
This paper presents a novel DC-offset and I/Q-mismatch compensation technique with short convergence time, high accuracy, and low-circuit-complexity. In this technique, all kinds of transmitter nonidealities, i.e. an offset and a mismatch, can be detected using adequate pair of DC test signals. The test signals are designed so that the envelope of the modulator RF outputs for each test signal fluctuates when the offset or mismatch exists. The fluctuations are converted to a baseband signal using an envelope detector which is designed as a signal dynamic range compressor to avoid saturation in following stages. The polarity of this fluctuation is detected by a comparator instead of a multi-bit analog to digital converter, and a binary-search-type algorithm optimizes parameters for the offset and mismatch compensation using the 1-bit comparator output. This technique was demonstrated in a 0.18-mum CMOS 5-GHz-band WLAN transmitter. The DC offset was suppressed to -43 dBc and the image tone was suppressed to -49 dBc.
Keywords
CMOS integrated circuits; comparators (circuits); modulators; radio transmitters; wireless LAN; CMOS direct-conversion WLAN transmitter; DC test signals; DC-offset; I/Q-mismatch compensation technique; baseband signal; binary-search-type algorithm; comparator; envelope detector; frequency 5 GHz; modulator RF outputs; multibit analog to digital converter; signal dynamic range compressor; size 0.18 mum; transmitter nonidealities; Baseband; CMOS technology; Convergence; Fluctuations; RF signals; Radio frequency; Signal design; Testing; Transmitters; Wireless LAN; DC offset; Direct conversion; I/Q mismatch; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location
Honolulu, HI
ISSN
0149-645X
Print_ISBN
1-4244-0688-9
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2007.380260
Filename
4263747
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