• DocumentCode
    2967554
  • Title

    A 2 Watt, Sub-dB Noise Figure GaN MMIC LNA-PA Amplifier with Multi-octave Bandwidth from 0.2-8 GHz

  • Author

    Kobayashi, Kevin W. ; Chen, Yaochung ; Smorchkova, Ioulia ; Tsai, Roger ; Wojtowicz, Mike ; Oki, Aaron

  • Author_Institution
    Sirenza Microdevices, Torrance
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    619
  • Lastpage
    622
  • Abstract
    This paper reports on a 0.2-8 GHz high dynamic range GaN MMIC LNA-PA which achieves sub-dB noise figure and a PldB of 2 watts. The GaN MMIC utilizes a 0.2 mum AlGaN/GaN-SiC HEMT technology with an fT ~75 GHz. At high power bias (15 V/400 mA), the MMIC amplifier achieves sub-dB NF ~0.7-0.9 dB over a 2-8 GHz band. At low bias(12 V, 200 mA), the amplifier achieves ~0.5dB over the same band. This is believe to be the lowest NF reported for a multi-octave MMIC amplifier in the S-and C-band frequency range. In addition, the amplifier obtains ultra high linearity with an OIP3 of 43.2-46.5 dBm and P1 dB of 32.8-33.2 dBm (2 watts) over a 2-6 GHz bandwidth. The PAE at P1 dB is ~28.6-31%. The Psat is 34.2 dBm with 39% PAE @ 2 GHz. To our knowledge, this is the first report of a multi-octave MMIC amplifier with sub-dB NF and a pout >2 Watt.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MMIC power amplifiers; aluminium compounds; field effect MMIC; gallium compounds; integrated circuit noise; low noise amplifiers; silicon compounds; AlGaN-GaN-SiC; C-band frequency; HEMT technology; MMIC LNA-PA amplifier; S-band frequency; frequency 0.2 GHz to 8 GHz; low noise amplifier; multioctave bandwidth; power 2 W; power amplifier; size 0.2 mum; sub-dB noise figure; ultra high linearity; Aluminum gallium nitride; Bandwidth; Dynamic range; Frequency; Gallium nitride; HEMTs; High power amplifiers; MMICs; Noise figure; Noise measurement; GaN HEMT; Low Noise Amplifier (LNA); Power Amplifier (PA); dynamic range;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.379977
  • Filename
    4263892