DocumentCode
2970290
Title
Logic-on-logic 3D integration and placement
Author
Thorolfsson, Thor ; Luo, Guojie ; Cong, Jason ; Franzon, Paul D.
Author_Institution
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
fYear
2010
fDate
16-18 Nov. 2010
Firstpage
1
Lastpage
4
Abstract
In this paper we describe three 3D standard cell placement algorithms, which are: “3D Placement using Sequential Off-the-Shelf 2D Placement Tools”, “True-3D Analytical Placement with mPL” and “3D Placement using Simultaneous 2D Placements with mPL”. We use these algorithms to place three case studies in a real face-to-face 3D integration process. The three case studies are a 2 point FFT butterfly processing element (PE), an Advanced Encryption Standard encryption block (AES) and a multiple-input and multiple-output wireless decoder (MIMO). The placements are then fully routed and compared to 2D placements in terms of performance and power consumption. Using this methodology we show that using 3D face-to-face integration with microbumps in conjunction with the three placement algorithms we can improve the maximum clock speed of AES module by 15.3% and the PE by 22.6%, while reducing the power of the AES module and the PE by 2.6% and 12.9% respectively.
Keywords
MIMO systems; cryptography; decoding; fast Fourier transforms; logic design; three-dimensional integrated circuits; 2 point FFT butterfly processing element; 3D face-to-face integration; 3D placement; 3D standard cell placement algorithms; AES module; MIMO; PE; advanced encryption standard encryption block; face-to-face 3D integration process; logic-on-logic 3D integration; maximum clock speed; microbumps; multiple-input and multiple-output wireless decoder; power consumption; sequential off-the-shelf 2D placement tools; simultaneous 2D placements with mPL; true-3D analytical placement with mPL; Clocks; Encryption; MIMO; Power demand; Routing; Three dimensional displays; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
3D Systems Integration Conference (3DIC), 2010 IEEE International
Conference_Location
Munich
Print_ISBN
978-1-4577-0526-7
Type
conf
DOI
10.1109/3DIC.2010.5751451
Filename
5751451
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