DocumentCode
2970833
Title
50% Drain Efficiency Doherty Amplifier with Optimized Power Range for W-CDMA Signal
Author
Yamamoto, Takashi ; Kitahara, Takaya ; Hiura, Shigeru
Author_Institution
Toshiba Corp., Yokohama
fYear
2007
fDate
3-8 June 2007
Firstpage
1263
Lastpage
1266
Abstract
A novel high-efficiency Doherty amplifier is presented. A carrier amplifier and a peak amplifier in the Doherty amplifier are set to asymmetrical drain voltages to extend the power range where a high drain efficiency of the Doherty amplifier is maintained. Matching circuits of the carrier amplifier and the peak amplifier are designed for each drain voltage so that the drain efficiency and signal linearity of the Doherty amplifier at a 9 dB backoff point from its saturated output power (Psat) become higher than those of a conventional Doherty amplifier. These simple steps optimize the power range of the Doherty amplifier for a wideband code-division multiple-access (W-CDMA) signal that has a peak-to-average power ratio (PAR) of 9 dB. A Doherty amplifier containing gallium nitride (GaN) high-electron-mobility transistors (HEMTs) achieves an adjacent channel leakage power ratio (ACLR) of -38 dBc and a drain efficiency of 50% at an output power of 45 dBm. This is the highest drain efficiency of a Doherty amplifier for a W-CDMA signal to the best of the authors´ knowledge.
Keywords
HEMT circuits; III-V semiconductors; UHF power amplifiers; code division multiple access; gallium compounds; microwave power amplifiers; wide band gap semiconductors; Doherty amplifier; GaN; HEMT; W-CDMA signal; adjacent channel leakage power ratio; asymmetrical drain voltages; carrier amplifier; drain efficiency; gallium nitride high-electron-mobility transistors; matching circuits; peak amplifier; peak-to-average power ratio; wideband code-division multiple-access signal; Broadband amplifiers; Gallium nitride; HEMTs; High power amplifiers; MODFETs; Multiaccess communication; Peak to average power ratio; Power amplifiers; Power generation; Voltage; Doherty amplifier; adjacent channel leakage power ratio (ACLR); drain efficiency; gallium nitride high-electron-mobility transistor (GaN HEMT); wideband code-division multiple-access (W-CDMA);
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location
Honolulu, HI
ISSN
0149-645X
Print_ISBN
1-4244-0688-9
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2007.380422
Filename
4264061
Link To Document