• DocumentCode
    2971166
  • Title

    Diagnosis of realistic bridging faults with single stuck-at information

  • Author

    Chess, B. ; Lavo, D.B. ; Ferguson, F.J. ; Larrabee, T.

  • Author_Institution
    Dept. of Comput. Eng., California Univ., Santa Cruz, CA, USA
  • fYear
    1995
  • fDate
    5-9 Nov. 1995
  • Firstpage
    185
  • Lastpage
    192
  • Abstract
    Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnosing bridging faults using single stuck-at dictionaries was applied only to small circuits, produced large and imprecise diagnoses, and did not take into account the Byzantine Generals Problem for bridging faults. We analyze the original technique and improve it by introducing the concepts of match restriction, match requirement, and failure recovery. Our new technique, which requires no information other than that used by standard stuck-at methods, produces diagnoses that are an order of magnitude smaller than those produced by the original technique and produces many fewer misleading diagnoses than that of traditional stuck-at diagnosis.
  • Keywords
    fault diagnosis; fault location; logic testing; failure analysis; failure recovery; fault diagnosis; match requirement; match restriction; realistic bridging faults diagnosis; single stuck-at dictionaries; single stuck-at information; stuck-at diagnosis; stuck-at methods; CMOS technology; Circuit faults; Circuit testing; Dictionaries; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis; Logic; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-8186-8200-0
  • Type

    conf

  • DOI
    10.1109/ICCAD.1995.480011
  • Filename
    480011