• DocumentCode
    2972120
  • Title

    A Voltage Fluctuation and Flicker Monitoring System Based on Wavelet Transform

  • Author

    Li, Zhenmei ; Shen, Jin ; Wei, Peiyu ; Li, Tianze

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Shandong Univ. of Technol., Zibo
  • fYear
    2008
  • fDate
    2-3 Aug. 2008
  • Firstpage
    310
  • Lastpage
    314
  • Abstract
    The voltage fluctuation and flicker monitoring system based on Wavelet Transform was developed by using the virtual instrument technology. The system consists of sensors, signal conditioning circuits, data acquisitions and computers. In the system, the arithmetic model of voltage fluctuation and flicker was established. This paper proposes a method of monitoring and analyzing voltage fluctuation and flicker based on the wavelet transform. In the system, the wavelet transform was applied to virtual instrument by using the MATLAB script node in LabVIEW, in which the signals were divided into multi-frequency bands according to the voltage flicker signal character, the feature of the flicker was extracted, frequency and amplitude of voltage fluctuation signal was gained, the moment at which voltage flicker occurs was detected.The evaluation indices of short-term flicker severity Pst are obtained by using statistic sorting algorithms.
  • Keywords
    fluctuations; power supply quality; virtual instrumentation; voltage measurement; wavelet transforms; data acquisitions; flicker monitoring system; sensors; signal conditioning circuits; virtual instrument; voltage fluctuation; wavelet transform; Arithmetic; Circuits; Computerized monitoring; Data acquisition; Instruments; Mathematical model; Sensor systems; Voltage fluctuations; Wavelet analysis; Wavelet transforms; LabVIEW; flicker; monitoring; voltage fluctuation; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Intelligent Transportation System, 2008. PEITS '08. Workshop on
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-0-7695-3342-1
  • Type

    conf

  • DOI
    10.1109/PEITS.2008.34
  • Filename
    4634866