• DocumentCode
    2972252
  • Title

    US-PCS SAW duplexer using high-Q SAW resonator with SiO2 coat for stabilizing temperature characteristics

  • Author

    Takayama, R. ; Nakanishi, H. ; Iwasaki, Y. ; Sakuragawa, T. ; Fujii, K.

  • Author_Institution
    Matsushita Electron. Components Co. Ltd., Osaka, Japan
  • Volume
    2
  • fYear
    2004
  • fDate
    23-27 Aug. 2004
  • Firstpage
    959
  • Abstract
    We have successfully developed SAW resonators with a SiO2 coat, which have both high-Q characteristics and stable temperature characteristics. We realized a SAW duplexer for the US PCS band (US-PCS) using these resonators. The frequency characteristics variation due to temperature change is usually taken into design consideration. However, in case of the US-PCS duplexer, which has a difficult frequency allocation for the transmission (Tx) band and the reception (Rx) band. A temperature coefficient (TC) reduction technology is essential to realize the US-PCS SAW duplexer. Of course, this TC reduction technique should not deteriorate the filter characteristics, such as insertion loss. In this report, we explain the TC reduction technique using a SiO2 layer and the US-PCS SAW duplexer employing these resonators. It shows good performance over the temperature range -30°C to +85°C.
  • Keywords
    Q-factor; UHF filters; silicon compounds; surface acoustic wave resonator filters; thermal stability; -30 to 85 degC; SAW duplexer; SiO2-LiTaO3; US PCS band; high-Q SAW resonator; insertion loss; temperature coefficient reduction; temperature stabilization; Insertion loss; Optical resonators; Q factor; Resonant frequency; Resonator filters; SAW filters; Surface acoustic wave devices; Surface acoustic waves; Temperature distribution; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2004 IEEE
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-8412-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2004.1417918
  • Filename
    1417918