• DocumentCode
    2973360
  • Title

    Scaling shrinkage-based language models

  • Author

    Chen, Stanley F. ; Mangu, Lidia ; Ramabhadran, Bhuvana ; Sarikaya, Ruhi ; Sethy, Abhinav

  • Author_Institution
    IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2009
  • fDate
    Nov. 13 2009-Dec. 17 2009
  • Firstpage
    299
  • Lastpage
    304
  • Abstract
    In we show that a novel class-based language model, Model M, and the method of regularized minimum discrimination information (rMDI) models outperform comparable methods on moderate amounts of Wall Street Journal data. Both of these methods are motivated by the observation that shrinking the sum of parameter magnitudes in an exponential language model tends to improve performance. In this paper, we investigate whether these shrinkage-based techniques also perform well on larger training sets and on other domains. First, we explain why good performance on large data sets is uncertain, by showing that gains relative to a baseline n-gram model tend to decrease as training set size increases. Next, we evaluate several methods for data/model combination with Model M and rMDI models on limited-scale domains, to uncover which techniques should work best on large domains. Finally, we apply these methods on a variety of medium-to-large-scale domains covering several languages, and show that Model M consistently provides significant gains over existing language models for state-of-the-art systems in both speech recognition and machine translation.
  • Keywords
    language translation; natural language processing; speech recognition; language model; machine translation; regularized minimum discrimination information models; shrinkage-based techniques; speech recognition; Acoustic testing; Automatic speech recognition; Interpolation; Large-scale systems; Natural languages; Performance gain; Predictive models; Speech recognition; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automatic Speech Recognition & Understanding, 2009. ASRU 2009. IEEE Workshop on
  • Conference_Location
    Merano
  • Print_ISBN
    978-1-4244-5478-5
  • Electronic_ISBN
    978-1-4244-5479-2
  • Type

    conf

  • DOI
    10.1109/ASRU.2009.5373380
  • Filename
    5373380