DocumentCode
2973360
Title
Scaling shrinkage-based language models
Author
Chen, Stanley F. ; Mangu, Lidia ; Ramabhadran, Bhuvana ; Sarikaya, Ruhi ; Sethy, Abhinav
Author_Institution
IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2009
fDate
Nov. 13 2009-Dec. 17 2009
Firstpage
299
Lastpage
304
Abstract
In we show that a novel class-based language model, Model M, and the method of regularized minimum discrimination information (rMDI) models outperform comparable methods on moderate amounts of Wall Street Journal data. Both of these methods are motivated by the observation that shrinking the sum of parameter magnitudes in an exponential language model tends to improve performance. In this paper, we investigate whether these shrinkage-based techniques also perform well on larger training sets and on other domains. First, we explain why good performance on large data sets is uncertain, by showing that gains relative to a baseline n-gram model tend to decrease as training set size increases. Next, we evaluate several methods for data/model combination with Model M and rMDI models on limited-scale domains, to uncover which techniques should work best on large domains. Finally, we apply these methods on a variety of medium-to-large-scale domains covering several languages, and show that Model M consistently provides significant gains over existing language models for state-of-the-art systems in both speech recognition and machine translation.
Keywords
language translation; natural language processing; speech recognition; language model; machine translation; regularized minimum discrimination information models; shrinkage-based techniques; speech recognition; Acoustic testing; Automatic speech recognition; Interpolation; Large-scale systems; Natural languages; Performance gain; Predictive models; Speech recognition; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Automatic Speech Recognition & Understanding, 2009. ASRU 2009. IEEE Workshop on
Conference_Location
Merano
Print_ISBN
978-1-4244-5478-5
Electronic_ISBN
978-1-4244-5479-2
Type
conf
DOI
10.1109/ASRU.2009.5373380
Filename
5373380
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