• DocumentCode
    2974637
  • Title

    Accuracy of micro four-point probe measurements on inhomogeneous samples: A probe spacing dependence study

  • Author

    Wang, Fei ; Petersen, Dirch H. ; Osterberg, Frederik W. ; Hansen, Ole

  • Author_Institution
    Dept. of Micro- & Nanotechnol., Tech. Univ. of Denmark, Lyngby, Denmark
  • fYear
    2009
  • fDate
    Sept. 29 2009-Oct. 2 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper, we discuss a probe spacing dependence study in order to estimate the accuracy of micro four-point probe measurements on inhomogeneous samples. Based on sensitivity calculations, both sheet resistance and Hall effect measurements are studied for samples (e.g. laser annealed samples) with periodic variations of sheet resistance, sheet carrier density, and carrier mobility. With a variation wavelength of ¿, probe spacings from 0.0012 to 1002 have been applied to characterize the local variations. The calculations show that the measurement error is highly dependent on the probe spacing. When the probe spacing is smaller than 1/40 of the variation wavelength, micro four-point probes can provide an accurate record of local properties with less than 1% measurement error. All the calculations agree well with previous experimental results.
  • Keywords
    Hall effect; carrier mobility; electron probes; inhomogeneous media; laser beam annealing; measurement errors; Hall effect measurements; carrier mobility; inhomogeneous samples; laser annealed samples; measurement error; microfour-point probe measurements; probe spacing dependence; sheet carrier density; sheet resistance; Annealing; Area measurement; Charge carrier density; Density measurement; Electrical resistance measurement; Hall effect; Measurement errors; Probes; Semiconductor laser arrays; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Thermal Processing of Semiconductors, 2009. RTP '09. 17th International Conference on
  • Conference_Location
    Albany, NY
  • ISSN
    1944-0251
  • Print_ISBN
    978-1-4244-3814-3
  • Electronic_ISBN
    1944-0251
  • Type

    conf

  • DOI
    10.1109/RTP.2009.5373449
  • Filename
    5373449