DocumentCode
2974976
Title
Heating and photoionization of silicon structures at laser treatments
Author
Bayazitov, R.M.
Author_Institution
Kazan Phys.-Tech. Inst., RAS, Kazan, Russia
fYear
2009
fDate
Sept. 29 2009-Oct. 2 2009
Firstpage
1
Lastpage
4
Abstract
The processes of light absorption, generation of electron-hole pairs and thermal heating of thin-film silicon structures under the action of high-power nanosecond laser pulses are considered. The computer simulation of heating and photoexcitation of the implanted Si is carried out. The simulation results are compared with the experimental data on optical probing. The density of the generated electron-hole pairs and the temperature dependence of the light absorption by Si for the laser radiation with ¿ = 1.06 ¿m are estimated. These data can be used to control the depth distribution of the absorbed energy of the laser radiation. The laser modification of thin-film materials on Si by the temperature-controlled Si transparency is carried out when treating structures by the radiation directed from backside of the crystalline Si substrate. This method allows one to increase the uniformity of the laser radiation along its cross-section, to reduce the surface overheating degree and to avoid the surface disruption.
Keywords
electron density; electron-hole recombination; elemental semiconductors; heat treatment; high-speed optical techniques; hole density; laser beam annealing; light absorption; photoexcitation; photoionisation; semiconductor thin films; silicon; solid-state plasma; surface treatment; thermo-optical effects; transparency; Si; computer simulation; crystalline Si substrate; electron-hole pair concentration; electron-hole pair recombination time; electron-hole plasma; high-power nanosecond laser pulses; laser annealing; laser radiation absorbed energy depth distribution; laser radiation uniformity; light absorption; photoexcitation; photoionization; surface overheating degree; temperature-controlled transparency; thermal heating; thin film silicon structures; wavelength 1.06 mum; Absorption; Computer simulation; Heat treatment; Heating; Ionization; Optical pulse generation; Semiconductor thin films; Silicon; Surface emitting lasers; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Thermal Processing of Semiconductors, 2009. RTP '09. 17th International Conference on
Conference_Location
Albany, NY
ISSN
1944-0251
Print_ISBN
978-1-4244-3814-3
Electronic_ISBN
1944-0251
Type
conf
DOI
10.1109/RTP.2009.5373466
Filename
5373466
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