• DocumentCode
    2978502
  • Title

    Capacitance estimation of PN varactors based on unit cells

  • Author

    Marrero-Martín, M. ; González, B. ; García, J. ; Hernández, A.

  • Author_Institution
    Inst. for Appl. Microelectron., Univ. de Las Palmas de Gran Canaria
  • fYear
    2009
  • fDate
    11-13 Feb. 2009
  • Firstpage
    471
  • Lastpage
    474
  • Abstract
    Integrated varactors are key elements in radio frequency integrated circuits. In this paper, several structures of varactors, based on p-n junction cells, are considered. A capacitance model is required to use these structures in a CAD environment. We have developed a model which considers area and perimeter capacitances of adjacent unit cells so as the reverse voltage dependence. Tuning ranges and quality factors are all well estimated. This model is applied to four varactors and their respective unit cells fabricated with AMS SiGe 0.35 mum technology. Modeled values are compared with measurements and the error between our estimations and measurements are smaller than 7% in all cases.
  • Keywords
    Ge-Si alloys; Q-factor; capacitance; p-n junctions; semiconductor materials; varactors; CAD environment; Si-Ge; capacitance model; integrated varactors; p-n junction cells; quality factors; radio frequency integrated circuits; reverse voltage; Anodes; Capacitance measurement; Circuit optimization; Geometry; Germanium silicon alloys; Q factor; Radiofrequency integrated circuits; Silicon germanium; Varactors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices, 2009. CDE 2009. Spanish Conference on
  • Conference_Location
    Santiago de Compostela
  • Print_ISBN
    978-1-4244-2838-0
  • Electronic_ISBN
    978-1-4244-2839-7
  • Type

    conf

  • DOI
    10.1109/SCED.2009.4800536
  • Filename
    4800536