DocumentCode
2979301
Title
Radiation effects in future electronics from device to systems — Roundtable report
Author
Flament, Olivier ; Brichard, Benoit ; Chugg, Andrew ; Dyer, Clive ; Edwards, Robert ; Ibe, Eishi ; Lacoe, Ron ; Paccagnella, Alessandro ; Holmes-Siedle, Andrew ; Leray, Jean-Luc
Author_Institution
Bruyeres-le-Chatel, CEA-DIF, Arpajon, France
fYear
2007
fDate
10-14 Sept. 2007
Firstpage
26
Lastpage
30
Abstract
Considering the technology trends of future electronics, panelists have reviewed some of the most demanding applications. These sectors were successively, the new nuclear physics facilities, for knowledge and for energy, and the vital issue of reliability of avionics systems.
Keywords
avionics; radiation effects; reliability; avionics system; electronics; nuclear physics facility; radiation effect; Radiation effects; Harsh environment; Nanoelectronics; Radiation effects;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location
Deauville
ISSN
0379-6566
Print_ISBN
978-1-4244-1704-9
Type
conf
DOI
10.1109/RADECS.2007.5205427
Filename
5205427
Link To Document