• DocumentCode
    2981482
  • Title

    Switching performance of AgW-Ag(Sn,In)O and AgW-AgSnO2 contact pairs

  • Author

    Slade, P.G. ; Chien, Y.K. ; Bindas, J.A.

  • Author_Institution
    Westinghouse R&D Center, Pittsburgh, PA, USA
  • fYear
    1989
  • fDate
    18-20 Sep 1989
  • Firstpage
    53
  • Lastpage
    67
  • Abstract
    Experiments were conducted to determine the switching performance of Ag-W contacts when operated in combination with Ag-(Sn,In)O and Ag-SnO2 materials. Contact pairs for each combination were evaluated in an experimental actuator at a current of 150 A. The Ag-W contact was always the moving contact. The experimental procedure consisted of the following steps: (1) the new contacts were closed, a steady current of 150 A was passed, and the voltage drop (Vc) across the contacts and the temperature rise ( Tr) of the back of the fixed contact were measured; and (2) the contacts then switched a 150-A, 600-V (rms) circuit for 2000 operations. After this, step (1) was repeated. Both the Ag-W vs. Ag-(Sn,In)O and the Ag-W vs. Ag-SnO2 contact pairs gave low values of Vc when new, a characteristics of good Ag-to-Ag contact. After 2000 operations the Vc values for both contact combinations were very high and variable. Metallurgical examination of the contacts showed arc-resistant, oxide surfaces containing complex oxides of Ag, Sn, and In alloys as well as complex tungstates formed from combinations of Ag, Sn, and In
  • Keywords
    electrical contacts; indium alloys; materials testing; scanning electron microscope examination of materials; silver alloys; tin alloys; tungsten alloys; 150 A; 600 V; Ag-SnO2-InO materials; AgW-AgSnInO; AgW-AgSnO2; arc resistant oxide surfaces; complex oxides; complex tungstates; contact pairs; contact resistance; current switching; experimental actuator; experimental procedure; switching performance; temperature rise; voltage drop; Actuators; Conducting materials; Contact resistance; Research and development; Surface resistance; Switches; Switching circuits; Tin; Tungsten; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1989., Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on
  • Conference_Location
    Chicago, IL
  • Type

    conf

  • DOI
    10.1109/HOLM.1989.77906
  • Filename
    77906