DocumentCode
2981626
Title
Charge yield and total ionizing dose measurements
Author
Haran, Avner ; Murat, Michael ; Barak, Joseph ; David, David
Author_Institution
Soreq NRC, Yavne, Israel
fYear
2007
fDate
10-14 Sept. 2007
Firstpage
1
Lastpage
6
Abstract
An experimental study of charge-yield of gamma and alpha radiation sources is presented. Monte-Carlo simulation is applied to explain the experimental results. Important implications of charge-yield to TID measurements using MOSFET dosimeters in space and other high energy particle environments are discussed.
Keywords
MOSFET; Monte Carlo methods; alpha-particle effects; dosimeters; field effect transistors; gamma-ray effects; ionisation; voltage regulators; Monte Caro simulation; alpha radiation; charge yield; dosimeters; gamma radiation; radiation sources; total ionizing dose measurements; Calibration; Charge measurement; Current measurement; Electron traps; Energy measurement; Ion accelerators; MOSFET circuits; Particle measurements; Protons; Space charge; Alpha particles; Angular dependence; Gamma radiation; Low dropout voltage regulator; Radiation sensing field effect transistor (RADFET);
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location
Deauville
ISSN
0379-6566
Print_ISBN
978-1-4244-1704-9
Type
conf
DOI
10.1109/RADECS.2007.5205537
Filename
5205537
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