Electron microscopic and X-ray diffraction investigations of nanostructured thin films of ZnO

ZnO films prepared by sol-gel technique using zinc nitrate and zinc acetate as precursor material have been studied using transmission electron microscopy (TEM) and X-ray diffraction (XRD) techniques. The results show the formation of zinc oxide phase. The nanostructure of the films was studied by transmission electron microscopy. Nano-structured fine grains of size ranging from 20-60 nm were observed with zinc nitrate precursor film. Individual grains show a sharp contrast with different facets and boundaries. Films prepared by zinc acetate precursor show ultra-fine nano-grains in the shape of dendrites as seen by the TEM. XRD shows a larger size of crystallites with the zinc acetate precursor. Crystal planes and lattice parameters calculated by both electron diffraction and X-ray diffraction are quite close and in agreement with the reported values in literature.