• DocumentCode
    2981976
  • Title

    Experimental study and analysis of soft errors in 90nm Xilinx FPGA and beyond

  • Author

    Lesea, A. ; Castellani-Coulié, K.

  • Author_Institution
    Xilinx, San Jose, CA, USA
  • fYear
    2007
  • fDate
    10-14 Sept. 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The Xilinx methodology used for soft error test and measurement in FPGAs is exposed. The technology scaling impact on SER from 250 nm down to 65 nm is presented and analyzed by comparing beam and real time testing. Some trends are presented and analyzed.
  • Keywords
    field programmable gate arrays; Xilinx FPGA; size 90 nm; soft errors; technology scaling; Application specific integrated circuits; Clocks; Error analysis; Field programmable gate arrays; Logic gates; Neutrons; Random access memory; Sea measurements; Silicon; Testing; Beam testing; FPGA; Real time testing; SER; Scaling; Soft Error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
  • Conference_Location
    Deauville
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4244-1704-9
  • Type

    conf

  • DOI
    10.1109/RADECS.2007.5205556
  • Filename
    5205556
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2981976