Fault-tolerance and terminal reliability for a class of data manipulator networks

Author

Abd-El-Barr, Mostafa ; Abed, Osama

Author_Institution

Dept. of Comput. Eng., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia

Volume

1

fYear

1994

fDate

3-5 Aug 1994

Firstpage

225

Abstract

Data manipulators networks are a class of multistage interconnection networks (MINs). A number of attempts has been made to make this class of MINs fault tolerant. They assume that the input stage as well as the output stage are fault-free. In this paper, we propose an enhancement to the fault-tolerance capability of two categories of this class of networks, Enhanced Augmented Data Manipulator Network (EADM), and Logical Neighborhood Networks (LN) under a more strict fault-model. The fault-tolerance and the terminal reliability for each of the resulting networks is introduced. A comparison between these two proposed networks is made

Keywords

circuit reliability; fault tolerant computing; multistage interconnection networks; data manipulator networks; enhanced augmented type; fault-model; fault-tolerance; logical neighborhood networks; multistage interconnection networks; terminal reliability; Computer network reliability; Computer networks; Delta modulation; Fault tolerance; Minerals; Multiprocessor interconnection networks; Network topology; Petroleum; Routing; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on

Conference_Location

Lafayette, LA

Print_ISBN

0-7803-2428-5

Type

conf

DOI

10.1109/MWSCAS.1994.519227

Filename

519227