• DocumentCode
    2984659
  • Title

    Implicit state transition graphs: applications to sequential logic synthesis and test

  • Author

    Ashar, Pranav ; Ghosh, Abhijit ; Devadas, Srinivas ; Newton, A. Richard

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    1990
  • fDate
    11-15 Nov. 1990
  • Firstpage
    84
  • Lastpage
    87
  • Abstract
    Implicit state enumeration is used in developing strategies to solve key problems in sequential logic synthesis and test. It is shown that it is possible to extract implicit state transition graphs (ISTGs) from logic-gate and flip-flop descriptions of sequential circuits that allow equivalent states to be represented by cubes, and edges from different states to be coalesced into one, thereby decreasing significantly the CPU time and memory requirements of the extraction process. Coupled with the enumeration technique, synthesis strategies are proposed for FSMs (finite state machines) described at the logic level. As is illustrated, these synthesis strategies allow the authors to optimize large FSMs. The authors apply an ISTG traversal algorithm for verifying equivalence and detecting redundancies in logic-level sequential circuits. This algorithm is more efficient than previously developed sequential test generation algorithms when used to detect equivalent-state redundancies present in some classes of circuits.<>
  • Keywords
    finite automata; logic CAD; logic testing; sequential circuits; cubes; edges; finite state machines; flip-flop; implicit state transition graphs; logic-gate; logic-level sequential circuits; memory requirements; sequential logic synthesis; test; Application software; Central Processing Unit; Circuit synthesis; Circuit testing; Coupling circuits; Flip-flops; Logic testing; Sequential analysis; Sequential circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1990. ICCAD-90. Digest of Technical Papers., 1990 IEEE International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-2055-2
  • Type

    conf

  • DOI
    10.1109/ICCAD.1990.129847
  • Filename
    129847