DocumentCode
2984732
Title
2002 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.02TH8658)
fYear
2002
fDate
20-20 Oct. 2002
Abstract
Presents the title page and table of contents for the 2002 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.02TH8658).
Keywords
III-V semiconductors; gallium arsenide; heterojunction bipolar transistors; high electron mobility transistors; hot carriers; integrated circuit reliability; life testing; semiconductor device reliability; GaAs; GaAs-based HBT reliability; GaN; GaN HEMTs; InP; InP-based HBT reliability; PHEMTs; accelerated life test; current collapse; hot electron effects; reliability tests;
fLanguage
English
Publisher
ieee
Conference_Titel
GaAs Reliability Workshop, 2002
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7908-0103-5
Type
conf
DOI
10.1109/GAAS.2002.1167851
Filename
1167851
Link To Document