• DocumentCode
    2985855
  • Title

    On a class of doubly-generalized LDPC codes with single parity-check variable nodes

  • Author

    Paolini, Enrico ; Flanagan, Mark F. ; Chiani, Marco ; Fossorier, Marc P C

  • Author_Institution
    DEIS/WiLAB, Univ. of Bologna, Cesena, Italy
  • fYear
    2009
  • fDate
    June 28 2009-July 3 2009
  • Firstpage
    1983
  • Lastpage
    1987
  • Abstract
    A class of doubly-generalized low-density parity-check (D-GLDPC) codes, where single parity-check (SPC) codes are used as variable nodes (VNs), is investigated. An expression for the growth rate of the weight distribution of any D-GLDPC ensemble with a uniform check node (CN) set is presented at first, together with an analytical technique for its efficient evaluation. These tools are then used for detailed analysis of a case study, namely, a rate-1/2 D-GLDPC ensemble where all the CNs are (7, 4) Hamming codes and all the VNs are length-7 SPC codes. It is illustrated how the VN representations can heavily affect the code properties and how different VN representations can be combined within the same graph to enhance some of the code parameters. The analysis is conducted over the binary erasure channel. Interesting features of the new codes include the capability of achieving a good compromise between waterfall and error floor performance while preserving graphical regularity, and values of threshold outperforming LDPC counterparts.
  • Keywords
    Hamming codes; parity check codes; Hamming codes; analytical technique; binary erasure channel; doubly-generalized LDPC codes; doubly-generalized low-density parity-check codes; single parity-check codes; single parity-check variable nodes; uniform check node set; Bipartite graph; Block codes; Educational institutions; Equations; Iterative decoding; Mechanical engineering; Parity check codes; Polynomials; Stability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2009. ISIT 2009. IEEE International Symposium on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-4312-3
  • Electronic_ISBN
    978-1-4244-4313-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2009.5205731
  • Filename
    5205731