DocumentCode
2986903
Title
Structural solution of reconfiguration based built-in self-test for analog and mixed-signal IC
Author
Mosin, Sergey
Author_Institution
Dept. of Comput. Eng., Vladimir State Univ., Vladimir, Russia
fYear
2010
fDate
4-6 Oct. 2010
Firstpage
141
Lastpage
144
Abstract
The structural solution of built-in self test for analog and mixed-signal IC based on reconfiguring original circuit in oscillator has been proposed. The principles of functioning and main components of the solution have been considered. The experimental results for active filter have been shown.
Keywords
active filters; analogue integrated circuits; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; oscillators; active filter; analog IC; built-in self-test; mixed-signal IC; oscillator; Radiation detectors; Robots; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Conference (BEC), 2010 12th Biennial Baltic
Conference_Location
Tallinn
ISSN
1736-3705
Print_ISBN
978-1-4244-7356-4
Electronic_ISBN
1736-3705
Type
conf
DOI
10.1109/BEC.2010.5630220
Filename
5630220
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