DocumentCode
2987525
Title
A 100MHz to 1GHz, 0.35V to 1.5V Supply 256 x 64 SRAM Block Using Symmetrized 9T SRAM Cell with Controlled Read
Author
Verkila, Satish Anand ; Bondada, Siva Kumar ; Amrutur, Bharadwaj S.
Author_Institution
IISc, Bangalore
fYear
2008
fDate
4-8 Jan. 2008
Firstpage
560
Lastpage
565
Abstract
In this paper, we present dynamic voltage and frequency Managed 256 x 64 SRAM block in 65 nm technology, for frequency ranging from 100 MHz to 1 GHz. The total energy is minimized for any operating frequency in the above range and leakage energy is minimized during standby mode. Since noise margin of SRAM cell deteriorates at low voltages, we propose static noise margin improvement circuitry, which symmetrizes the SRAM cell by controlling the body bias of pull down NMOS transistor. We used a 9T SRAM cell that isolates Read and hold noise margin and has less leakage. We have implemented an efficient technique of pushing address decoder into zigzag- super-cut-off in stand-by mode without affecting its performance in active mode of operation. The read bit line (RBL) voltage drop is controlled and pre-charge of bit lines is done only when needed for reducing power wastage.
Keywords
MOSFET; SRAM chips; integrated circuit design; integrated circuit noise; 9T SRAM cell; NMOS transistor; dynamic frequency scaling; dynamic voltage scaling; frequency 100 MHz to 1 GHz; leakage energy; read and hold noise margin; read bit line; size 65 nm; static noise margin improvement circuit; voltage 0.35 V; Circuit noise; Circuits and systems; Decoding; Dynamic voltage scaling; Frequency; Low voltage; MOSFETs; Random access memory; Very large scale integration; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2008. VLSID 2008. 21st International Conference on
Conference_Location
Hyderabad
ISSN
1063-9667
Print_ISBN
0-7695-3083-4
Type
conf
DOI
10.1109/VLSI.2008.89
Filename
4450558
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