DocumentCode
2990834
Title
Developing a social capital metric for use in an educational computer game
Author
Gennett, Zachary A. ; Isaacs, Jacqueline A. ; Seager, Thomas P.
Author_Institution
Mech. & Ind. Eng. Dept., Northeastern Univ., Boston, MA, USA
fYear
2010
fDate
17-19 May 2010
Firstpage
1
Lastpage
6
Abstract
To address the educational challenges of Millennial Generation students, there has been an increased willingness at many universities to experiment with pedagogical strategies that depart from a traditional “learning by listening” model, to more innovative methods involving active learning through computer games. We hypothesize that to acquire the skills necessary to manage social sustainability, students must be engaged in active learning exercises that foster a high level of social interaction. This has led to the development of an educational computer game, entitled Shortfall, which simulates a business milieu for testing alternative paths regarding the principles of sustainability. This paper examines social sustainability in the context of industry and through the lens of a capital-based theory of sustainability. Using a capital-based theory, the analysis of social sustainability is narrowed to the concept of social capital. The current methodologies used for measuring social capital are reviewed, and a prospective metric using a peer evaluation survey, unique to Shortfall, is developed.
Keywords
computer aided instruction; computer games; software metrics; Shortfall; active learning exercises; capital-based theory; educational computer game; millennial generation students; social capital metric; social interaction; social sustainability; Automobiles; Computational modeling; Computer simulation; Education; Environmental economics; Environmental management; Supply chain management; Testing; Vehicle dynamics; Virtual environment; Computer Games; Millennial Generation; Shortfall; Social Capital; Sustainability;
fLanguage
English
Publisher
ieee
Conference_Titel
Sustainable Systems and Technology (ISSST), 2010 IEEE International Symposium on
Conference_Location
Arlington, VA
Print_ISBN
978-1-4244-7094-5
Type
conf
DOI
10.1109/ISSST.2010.5507720
Filename
5507720
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