DocumentCode
2991985
Title
Dynamic characterization of Semiconductor Ring Lasers: Frequency response and linewidth enhancement factor
Author
Zanola, Marco ; Mezosi, Gabor ; Furst, Sandor ; Sorel, Marc ; Giuliani, Guido
Author_Institution
Dipt. di Elettron., Univ. di Pavia, Pavia
fYear
2008
fDate
14-18 Sept. 2008
Firstpage
127
Lastpage
128
Abstract
The frequency response and alpha factor of monolithic semiconductor ring lasers (SRLs) with 150 micron radius are measured using an all-optical modulation technique, yielding a -3 dB, frequency of 11 GHz and alpha factor of 2.4.
Keywords
frequency response; laser beams; laser cavity resonators; optical modulation; ring lasers; semiconductor lasers; all-optical modulation technique; alpha factor; dynamic characterization; frequency 11 GHz; frequency response; linewidth enhancement factor; monolithic semiconductor ring lasers; radius 150 mum; Current measurement; Fiber lasers; Flip-flops; Frequency measurement; Frequency response; Optical bistability; Optical modulation; Optical waveguides; Ring lasers; Semiconductor lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Laser Conference, 2008. ISLC 2008. IEEE 21st International
Conference_Location
Sorrento
Print_ISBN
978-1-4244-1782-7
Electronic_ISBN
978-1-4244-1783-4
Type
conf
DOI
10.1109/ISLC.2008.4636042
Filename
4636042
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