DocumentCode
2992060
Title
Using ultrasonic energy for reducing ACF bonding process time
Author
Tae-Young Jang ; Yun, Won-Su ; Soo-Hyun Kim ; Kim, Kyung-Soo
Author_Institution
Dept. of Mechanical Engineering, KAIST, 335 Gwahang-no, Daedeuk Science Town, Daejeon, KOREA
fYear
2008
fDate
4-6 Nov. 2008
Firstpage
1
Lastpage
6
Abstract
In this paper, we develop the novel ultrasonic bonding method for mounting LCD driver IC which has a number of small bumps with high pin-density. Since the materials for bumps and pads are different metals, the an-isotropic conductive film (ACF) is used for adhesion. The conventional methods based on the thermal energy under pressure suffer from the high failure rate at high temperature process and, in particular, the low productivity due to the long bonding process time. To avoid these, the thermo-compression ultrasonic approach is newly proposed, and, validated by experiments. The experimental results show that lower values of bonding pressure and temperature than recommended by the ACF specification can be adopted for reliable bonding, which proves the feasibility of the ultrasonic bonding technique. In addition, we address a new concept of horn design for high precision bonding. Since the proposed method is utilizing the mechanical vibration, the misalignment between bumps and pads may be the major issue. To solve this, the active controllable horn design is further discussed.
Keywords
Bonding processes; Closed loop systems; Fixtures; Flip chip; Nickel; Printers; Printing; Semiconductor device measurement; Semiconductor device packaging; Vacuum technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location
Penang, Malaysia
ISSN
1089-8190
Print_ISBN
978-1-4244-3392-6
Electronic_ISBN
1089-8190
Type
conf
DOI
10.1109/IEMT.2008.5507776
Filename
5507776
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