• DocumentCode
    2992580
  • Title

    Prediction studies on percolation threshold behaviour of silver filled epoxy composite for electrically conductive adhesives applications

  • Author

    Zulkarnain, M. ; Mariatti, M. ; Azid, I.A.

  • Author_Institution
    Sch. of Mech. Eng., Univ. Sains Malaysia, Nibong Tebal, Malaysia
  • fYear
    2008
  • fDate
    4-6 Nov. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Electrically conductive adhesives (ECAs) has received considerable interest as a solder replacement in flip chip packaging because of their advantages such as significant reduction in pitch, weight and volume and increased environmental compatibility. Conductivity of the ECA polymers can be described by percolation threshold which can be achieved by the addition of silver (Ag) nanoparticles in polymer matrix. In this present study, the existing electrical conductivity models were used to predict the percolation threshold phenomena in the conductive polymer composites. The electrical property characterization was modelled by finite element and statistical approach that assumes the transition of insulator to conductor at certain filler content. The model was developed based on spherical shape of Ag filler. From the study, it was found that the electric field and current density forces of spherical particles are governed by a dispersion of particle in the polymer matrix and filler content.
  • Keywords
    adhesives; electrical conductivity; electronics packaging; filled polymers; flip-chip devices; silver; conductive polymer composites; electrical conductivity model; electrically conductive adhesives application; environmental compatibility; filler content; finite element modelling; flip chip packaging; nanoparticles; percolation threshold behaviour; polymer matrix; prediction studies; silver filled epoxy composite; solder replacement; Conductive adhesives; Conductivity; Dielectrics and electrical insulation; Finite element methods; Flip chip; Nanoparticles; Packaging; Polymers; Predictive models; Silver; Conductivity; Current Density; Electric Field; Spherical Particle;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
  • Conference_Location
    Penang
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-3392-6
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2008.5507799
  • Filename
    5507799