DocumentCode
2992923
Title
Delay defect screening using process monitor structures
Author
Mitra, Subhasish ; Volkerink, Erik ; McCluskey, E.J. ; Eichenberger, Stefan
Author_Institution
Intel Corp., Sacramento, CA, USA
fYear
2004
fDate
25-29 April 2004
Firstpage
43
Lastpage
48
Abstract
This paper presents delay test data collected from test chips fabricated in a 0.18 μ technology. The experimental data shows that process monitor structures such as on-chip ring oscillators are effective in identifying slow parts while performing transition fault testing at frequencies slower than the rated frequency.
Keywords
delays; digital signal processing chips; fault diagnosis; integrated circuit testing; oscillators; process monitoring; system-on-chip; delay defect screening; delay test data; digital signal processing chips; on-chip ring oscillators; process monitor structures; test chips; transition fault testing; Delay; Monitoring; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
ISSN
1093-0167
Print_ISBN
0-7695-2134-7
Type
conf
DOI
10.1109/VTEST.2004.1299224
Filename
1299224
Link To Document