DocumentCode
2992985
Title
Development of quantum functional devices for multiple-valued logic circuits
Author
Baba, Toshio
Author_Institution
Fundamental Res. Labs., NEC Corp., Ibaraki, Japan
fYear
1999
fDate
1999
Firstpage
2
Lastpage
9
Abstract
Quantum functional devices exhibiting unique current-voltage characteristics are reported for the application of multiple-valued logic circuits. Multiple negative-differential-resistance (NDR) characteristics in drain current-voltage characteristics are demonstrated by using multiple-junction surface tunnel transistors (MJ-STTs). Some multiple-valued logic gates such as inverter and literal are implemented using the MJ-STTs. Oscillatory characteristics of drain current under gate modulation are shown by single electron transistors. Nonvolatile multiple-valued memory devices utilizing these unique characteristics are described, and the fundamental operation of write and read of stored electrons are demonstrated
Keywords
multivalued logic circuits; quantum gates; tunnel transistors; MJ-STTs; drain current under gate modulation; drain current-voltage characteristics; inverter; literal; multiple-junction surface tunnel transistors; multiple-valued logic circuits; multiple-valued logic gates; negative-differential-resistance; quantum functional devices; Energy consumption; Logic circuits; Logic devices; MOSFETs; National electric code; Quality function deployment; Rain; Single electron transistors; Ultra large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Multiple-Valued Logic, 1999. Proceedings. 1999 29th IEEE International Symposium on
Conference_Location
Freiburg
ISSN
0195-623X
Print_ISBN
0-7695-0161-3
Type
conf
DOI
10.1109/ISMVL.1999.779687
Filename
779687
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