DocumentCode
2994031
Title
Author index
fYear
2004
fDate
29-29 April 2004
Firstpage
405
Lastpage
406
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Conference_Location
Napa Valley, CA, USA
ISSN
1093-0167
Print_ISBN
0-7695-2134-7
Type
conf
DOI
10.1109/VTEST.2004.1299270
Filename
1299270
Link To Document