DocumentCode
2996717
Title
Integrated system design, analysis and database-driven simulation model generation
Author
Jeong, Ki-Young ; Allan, David
Author_Institution
United Technol. Res. Center, East Hartford, CT, USA
fYear
2004
fDate
18-22 April 2004
Firstpage
80
Lastpage
85
Abstract
This paper discusses an integrated framework of IDEF methods for generating a common data model usable for discrete manufacturing systems. From this data model, a simulation model is automatically generated using a database-driven and atom-based approach. A case study has been included to demonstrate the concept. A prototype function model, a data model and the resulting simulation model were constructed to show the feasibility of the approach. The concept and guidelines provided are expected to increase knowledge reusability between IDEF methods and improve simulation model reusability and maintainability through the features of the relational database technologies. Although the case study was performed for a semiconductor manufacturer, this concept can be easily extended to other areas.
Keywords
data models; electronic engineering computing; electronics industry; manufacturing systems; relational databases; semiconductor device manufacture; systems engineering; IDEF methods; atom-based simulation model; data model; database-driven simulation model generation; discrete manufacturing systems; integrated system analysis; integrated system design; knowledge reusability; prototype function model; relational database; semiconductor manufacturer; simulation model maintainability; simulation model reusability; Analytical models; Data analysis; Data models; Failure analysis; Guidelines; Manufacturing systems; Relational databases; Silver; System analysis and design; Virtual prototyping;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Symposium, 2004. Proceedings. 37th Annual
ISSN
1080-241X
Print_ISBN
0-7695-2110-X
Type
conf
DOI
10.1109/SIMSYM.2004.1299468
Filename
1299468
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