Weak signal measurement via an accurate cross-spectral SVD-TLS approach

Author

Ma, Yan ; Shi, Yaowu ; Dai, Yisong

Author_Institution

Inst. of Inf. Sci. & Eng., Jilin Univ. of Technol., Changchun, China

fYear

2000

fDate

2000

Firstpage

275

Lastpage

278

Abstract

This paper describes an accurate cross-spectral Singular Value Decomposition-Total Least Squares (SVD-TLS) method to measure the frequencies of weak sinusoidal signals in measurement noise. The new algorithm can overcome efficiently the shortcomings of low resolution caused by characteristic equation extention and distinguish perfectly the false peaks from the harmonic signal peaks in power spectrum figures. Simulation results show that this new cross-spectral SVD-TLS algorithm can eliminate spectral false peaks and have high resolution

Keywords

least squares approximations; measurement theory; random noise; signal processing; singular value decomposition; spectral analysis; coloured noise; cross-spectral SVD-TLS approach; false peak removal; harmonic signal peaks; high resolution; measurement noise; singular value decomposition; spectral estimation; total least squares method; weak signal measurement; weak sinusoidal signals; Amplitude estimation; Colored noise; Equations; Frequency estimation; Frequency measurement; Information science; Noise measurement; Phase estimation; Signal processing; Signal resolution;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2000. IEEE APCCAS 2000. The 2000 IEEE Asia-Pacific Conference on

Conference_Location

Tianjin

Print_ISBN

0-7803-6253-5

Type

conf

DOI

10.1109/APCCAS.2000.913487

Filename

913487